Sample rack handler and rotation assembly for a sample analysis system

ABSTRACT

An embodiment is a sample analysis system for analyzing a sample that includes at least one test device for analyzing the sample. The system also includes a rack handler operable to move a sample from a first location to a second location along a travel path. The rack handler has a rotation assembly including a) an engagement element for engagement with the sample rack, and b) a motor coupled to the engagement element and is operable to cause rotation of the engagement element. The rotation assembly rotates the sample rack from a first orientation into a second orientation along the travel path when the engagement element engages the sample rack.

The subject application claims benefit under 35 USC § 119(e) of U.S.provisional Application No. 62/504,118, filed May 10, 2017. The entirecontents of the above-referenced patent application are hereby expresslyincorporated herein by reference.

TECHNICAL FIELD

The present disclosure relates to a sample rack handler and rotationassembly for a sample analysis system.

BACKGROUND

Diagnostic methods may include testing a sample to measure sampleproperties and/or to detect substances of interest that may be presentin the sample. In the field of urinalysis, urine chemistry and sedimentsare commonly analyzed. The liquid sample usually contains one or moreanalytes/particles of interest. For urine chemistry analysis, thepresence and concentrations of the analytes of interest in the sampleare determinable by an analysis of the color changes undergone by thereagent pads that have been submerged in the liquid sample. For urinesediment analysis, the presence and concentrations of the particles ofinterest are measured by microscopic image analysis. These analyses maybe done manually or using automated test device.

Samples may be presented to the test device via a sample rack that holdsmultiple sample collection units, e.g. sample tubes. Typically, atransport system is used to present the sample rack, containing thesample collection units, to the test device by moving sample rackshorizontally along a travel path that has a U-shape. The U-shaped travelpath has a first leg that can stage multiple sample racks, a lateralportion adjacent the test device, and a second leg that is parallel tothe first leg. The sample racks are staged in the first leg of thetravel path and the transport system moves the sample rack in a firstdirection to the lateral portion that is adjacent to the test device.Then, the sample rack is translated laterally into a test positionadjacent the test device along that lateral portion. When the testprocedure is complete, the transport system moves the sample rack againlaterally. After the last lateral movement of the sample rack, thetransport system then moves the sample rack in a second direction alongthe second leg into an additional staging region.

SUMMARY

An embodiment of the disclosure is a sample analysis system foranalyzing a sample that includes at least one test device for analyzingthe sample. The system also includes a rack handler operable to move asample from a first location to a second location along a travel path.The rack handler has a rotation assembly including a) an engagementelement for engagement with the sample rack, and b) a motor coupled tothe engagement element and is operable to cause rotation of theengagement element. The rotation assembly rotates the sample rack from afirst orientation into a second orientation along the travel path whenthe engagement element engages the sample rack.

Another embodiment of the present disclosure is a rack handler for asample analysis system. The rack handler includes a travel path alongwhich a sample rack moves from one location to another location. Therack handler also includes a rotation assembly for rotating a samplerack that includes a slot. The rotation assembly has an engagementelement including a base and a protrusion that projects upward from thebase with the protrusion being sized to engage the slot of the samplerack. The rotation assembly also includes a motor coupled to theengagement element and being operable to cause the engagement element torotate. Rotation of the engagement element when the protrusion engagesthe slot causes the sample rack to rotate about a vertical axis.

Another embodiment is a method of moving a sample rack on a sampleanalysis system. The method includes moving the sample rack along atravel path until an engagement element of a rotation assembly isreceived by a slot defined by the sample rack. The method also includesrotating the engagement element about a vertical axis a first rotationaldistance in a first rotational direction until the engagement elementengages an interference groove in the slot of the sample rack. After theengagement element engages the interference groove, further rotation ofthe engagement element about the vertical axis in the first rotationaldirection rotates the sample rack from a first orientation into a secondorientation that is different from the first orientation.

BRIEF DESCRIPTION OF THE DRAWINGS

The foregoing summary, as well as the following detailed description ofillustrative embodiments of the present application, will be betterunderstood when read in conjunction with the appended drawings. For thepurposes of illustrating the present application, there is shown in thedrawings illustrative embodiments of the disclosure. It should beunderstood, however, that the application is not limited to the precisearrangements and instrumentalities shown. In the drawings:

FIG. 1 is a schematic plan view of a sample analysis system according toan embodiment of the present disclosure;

FIG. 2A is a perspective view of a rack handler and sample rack used inthe system shown in FIG. 1;

FIG. 2B is a top plan view of the rack handler shown in FIG. 2A;

FIG. 3A is a top perspective view of a portion of the rack handler shownin FIG. 2A;

FIG. 3B is a top perspective view of a portion of a rotation assemblyshown in FIG. 3A;

FIG. 3C is a side view the portion of a rotation assembly shown in FIG.3B;

FIG. 4 is a schematic diagram illustrating a control system used in therack handler shown in FIG. 2A;

FIG. 5 is a perspective view of the sample rack used in the systemillustrated in FIG. 1;

FIG. 6 is a rear elevation view of the sample rack illustrated in FIG.5;

FIG. 7 is a bottom plan view of the sample rack illustrated in FIG. 5;

FIG. 8 is a detailed view of a portion of the bottom of the sample rackillustrated in FIG. 5;

FIG. 9 is a detailed perspective view of a portion of the bottom of thesample rack illustrated in FIG. 5;

FIG. 10 is a perspective view of a portion of the rack handler in FIG.2A, illustrating the sample rack engaged with a rotation assembly in afirst configuration;

FIG. 11 is a perspective view of a portion of the rack handler in FIG.2A, illustrating the sample rack engaged with a rotation assembly in asecond, engaged configuration;

FIG. 12 is a cross-sectional view of a portion of the rack handler takenalong line A-A in FIG. 10, illustrating the sample rack engaged with therotation assembly in the first configuration;

FIG. 13 is a sectional view of a portion of the rack handler taken alongline B-B in FIG. 11, illustrating the sample rack engaged with arotation assembly in the second, engaged configuration;

FIG. 14 is a plan view of the rack handler with a sample rack shown inan input staging region;

FIG. 15 is a plan view of the rack handler with the sample rack shownadjacent to test device prior to the sample rack being staged in atesting position;

FIG. 16 is a plan view of the rack handler with the sample rack shownadjacent to test device after the sample rack is moved out of thetesting position;

FIG. 17 is a plan view of the rack handler with the sample rack shownadvanced into engagement with the rotation assembly and in the firstorientation;

FIG. 18 is a plan view of the rack handler showing the sample rackrotated into a different orientation;

FIG. 19 is a plan view of the rack handler with the sample rack shown ina completed turn and engaged with the rotation assembly and in a secondorientation; and

FIG. 20 is a plan view of the rack handler with the sample rack shownadvanced off of the rotation assembly and positioned for transport toanother test device.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

Referring to FIG. 1, embodiments of the present disclosure include asample analysis system 1 for analyzing samples. The sample analysissystem 1 includes one or more test devices 10, 20, a computing device 30electronically coupled to the test devices 10, 20, a sample rack handler100, and multiple sample racks 200. The sample racks 200, hold samplecollection units 50. Each sample collection unit 50 may contain a samplefor testing.

The computing device 30 may be used to control operation of the sampleanalysis system 1. The computing device 30 may include typicalcomponents of a computer, including a memory, one or more processors, auser interface, input/output ports, and various software applicationsused to run the sample analysis system 1. The computing device 30 may bea separate component as illustrated. Alternatively, the computing device30 may integrated with either or both test devices 10, 20.

As discussed above, the sample analysis system 1 may include at leastone test device, e.g. a first test device 10 and a second device 20. Thefirst and second test devices 10 and 20 are designed to analyze analytesof interest in the sample. In the illustrated embodiment, the first testdevice 10 is configured to analyze the sample contained in the samplecollection unit 50. For example, the test device 10 may include adevice, such as a color imager, that determines the color of the sampleapplied to one or more of the reagent pads on a test strip. Other typesof systems may include a spectrophotometer that determines color changesbased on reflectance readings, or digital microscope that uses specialalgorithm to classify particles based the size, shape and texture. Testdevices 10 (or 20) may employ a variety of area array detectionread-heads utilizing CCD (charge-coupled device), CID (charge-injectiondevice) or PMOS (P-type metal-oxide-semiconductor) detection structuresfor detecting color changes to the reagent pads. The color changes canbe used to determine the presence of analytes of interest. While aspectrophotometer is described above, other systems for testing a samplemay be used in the sample analysis system 1 and the present disclosureis not strictly limited to optical based systems.

Multiple test devices 10 and 20 may be used for robust evaluations ofsamples. If the data obtained by the first test device 10 indicates aneed for further analysis, the rack handler 100 conveys the sample rack200 and sample collection units 50 to the second test device 20. Furthertests are performed on the samples by the second test device 20.However, it should be appreciated that the inventive concepts asdescribed herein are not strictly limited to analysis systems thatinclude two or more separate test devices.

As best shown in FIGS. 1 and 2, the second test device 20 includes ahousing 22 and an analyzer (not shown) contained in the housing 22. Thehousing 22 is coupled to the rack handler 100 and includes front panelnear where the rack handler 100 is coupled to the second test device 20.The front panel 24 includes a portal 26 through which the sample rack200 travels if it is determined that a sample in the sample rack 200needs further analysis by the second test device 20.

Referring to FIG. 1, the sample rack handler 100 includes a base 118, atransport system 120, and a rotation assembly 150. The sample rackhandler 100 defines a travel path P along which the transport system 120guides the sample racks 200. As illustrated, the sample rack handler 100includes an input staging region 102 where sample racks 200 to be testedmay be staged, a lateral portion 104, a rotation region 106, a travelregion 108, and an output staging region 110 where sample racks 200 maybe collected once testing is complete. The rack handler 100 asillustrated includes a serpentine travel path P. It should beappreciated that the inventive concepts disclosed herein are not limitedto the specific travel path shown. Accordingly, the sample rack handler100 as disclosed herein may be used with any type of sample analysissystem that needs to move a sample rack from one location to anotherlocation and may need to change the orientation of the sample rack fromone orientation to another orientation.

The transport system 120 can hold and convey multiple sample racks 200along the travel path P from the input staging region 102 to the firsttest device 10, from the first test device 10 to the second test device20, and further into the output staging region 110. The transport system120 may include guide elements 130, one or more belts 132, and motors(not shown) that are used to advance the sample racks 200 along thetravel path P. As best shown in FIG. 2B, guide elements 130 may comprisemovable tabs that travel along the path P and can push the sample racks200 along the travel path P into the desired position. The transportsystem 120 may be electronically coupled to a control system 300 (SeeFIG. 4) that will be described further below.

Referring back to FIGS. 2A-3C, the rack handler 100 includes a rotationassembly 150 that is used to change the orientation of the sample rack200 along the travel path P. The rotation assembly 150 includes anengagement element 160 that extends along a vertical axis 4. Theengagement element 160 has a base 162 and a protrusion 164 that projectsupward from the base 162. The protrusion 164 can engage the sample rackas discussed further below. The rotation assembly 150 also includes amotor 330 coupled to the engagement element 160 and operable to causethe engagement element 160 to rotate about the vertical axis 4. Rotationof the engagement element 160 about the vertical axis 4 causes thesample rack to rotate about the vertical axis V when the engagementelement 160 is engaged with the sample rack 200.

FIGS. 3A-3C illustrate an exemplary engagement element 160. Theengagement element 160 may be any structure or device that canselectively engage and/or be coupled to a sample rack 200. In theembodiment illustrated, the engagement element includes the base 162,which forms a body 166 having an upper surface 168, a lower surface 170opposite the upper surface 168 along the vertical axis 4, and a centralrecess 172 that extends from the lower surface 170 into the base 162along the vertical axis 4. A shaft 174 extends from the motor 330 andinto the central recess 172 of the engagement element 160 torotationally couple the engagement element 160 to the motor 330. Themotor 330 may be electrically coupled to a controller 310 in the controlsystem 300 as further explained below and illustrated in FIG. 4. Thebase 162 is a structure that supports the protrusion 164 and providesenables coupling the motor 330 to the engagement element 160 via theshaft 174. Any particular structure may be used to form the base 162.The base 162 and protrusion 164 may be monolithic. Alternatively, thebase 162 and the protrusion 164 may be separate components that arecoupled together during manufacture of the rotation assembly 150.

Continuing with FIGS. 3B and 3C, the protrusion 164 may be designed toengage with sample rack 200. As shown, the protrusion projects 164 fromthe base along the vertical axis 4 and may define an elongated tab thatis sized to fit within the slot 270 (FIG. 8) of the sample rack. Theprotrusion 164 defines a first end 180 and a second end 182 that isopposite the first end 180 along a first axis 6 that is perpendicular tothe vertical axis 4. The protrusion 164 also includes a first side 184that extends between the first and second ends 180, 182, and a secondside 186 that extends between the first and second ends 180, 182. Thefirst and second sides 184 and 186 are shown disposed on opposite sidesof the vertical axis 4. The protrusion 164 defines a length L thatextends from the first end 180 to the second end 182 along a first axis6 that intersects and is perpendicular to the vertical axis 4, and awidth W that extends from the first side 184 to the second side 164along a second axis 8 that intersects and is perpendicular to the firstaxis 6 and the vertical axis 4. In the embodiment shown, the length L ofthe protrusion 164 is greater than the width W of the protrusion 164.The protrusion 164 also includes a top surface 188 and a height H thatextends from an upper surface 168 of the base 162 to the top surface 188along the vertical axis 4. In one example, the height H is less than thelength L.

The engagement element 160 may comprise a protrusion 164 with aconfiguration other than what is illustrated and described above. Inalternative embodiments, for example, the protrusion 164 may have anypolygonal cross-sectional shape that is defined perpendicular thevertical axis 4. For example, the protrusion can have cross-sectionalshape that is a square, a triangle, a pentagon, a hexagon, an octagon,or other shapes that have three or more sides. In another alternativeembodiment, the engagement element 160 may comprise a plurality ofprotrusions (not shown) that are spaced apart and aligned with eachother along an axis that intersects and is perpendicular to the verticalaxis 4. For instance, the engagement element 160 may include a firstprotrusion and a second protrusion that is spaced apart from and alignedwith the first protrusion along the axis. In such an embodiment, thefirst and second protrusions are positioned to engage the slot of thesample rack.

The rotation assembly 150 is operable to cause the engagement element160 to rotate about the vertical axis 4 to cause the sample rack 200 topivot. In the embodiment shown, the engagement element 160 is rotatablein a first rotational direction R1 and a second rotational direction R2that is opposite the first rotational direction R1. The rotationaldirection of the engagement element 160 is based, in part, on itsengagement with the sample rack 200 and the orientation of the samplerack 200. How the rotation assembly 150 operates to pivot the samplerack from the first orientation to a second orientation is described infurther detail below.

FIG. 4 illustrates a control system 300 used to control operation of atleast the rack handler 100. The control system 300 includes one or morecontrollers 310, at least one motor 330 that is electrically coupled tothe controller 310, and a plurality of sensors electrically coupled tothe controller 310. The controller 310 includes at least one processingunit 312, a memory unit 314, and communications unit 316. The sensorsare positioned along various portions of the travel path P and may beconfigured to detect the presence of a sample rack 200 proximate to aparticular sensor. In the embodiment illustrated, the control systemincludes a first sensor 352, a second sensor 354 and optionally one ormore additional sensors. The sensors 352 and 354 obtain sensor dataconcerning a position of the sample rack that is transmittedelectronically to the controller 310 through the communications unit314. In this regard, the sensors 352 and 354 are position sensors, suchas Hall Effect sensors. However, other sensors could be used todetermine rack 200 position. The controller 310, in turn, causes themotor 330 to operate based on the position data of the sample rack 200obtained via the sensors described above. Operation of the rack handler100 to move the sample racks 200 along the travel path P will bedescribed further below.

FIGS. 5-9 illustrate a sample rack 200 adapted to engage the rackhandler 100. The sample rack 200 includes a rack body 202, a bottom 205,and a top 203 spaced from the bottom 205 along a vertical direction V.The rack body 202 further defines a top surface 204 at the top 203 and abottom surface 206 at the bottom 205 that opposite the top surface 204along the vertical direction V. The rack body 202 further includes afirst side 208, a second side 210 opposite the first side 208 along atransverse direction T, a first end 212, and a second end 214 oppositethe first end 212 along a longitudinal direction L. In the drawings, thelongitudinal direction L is perpendicular to the vertical direction Vand to the transverse direction T. As illustrated, the rack body 202further includes a base portion 220 that defines the bottom surface 206,and a rack portion 230 that extends upwardly from the base portion 220along the vertical direction V. The rack portion 230 defines the topsurface 204. The rack body 202 includes at least one receptacle 240(such as a plurality of receptacles). The receptacle 240 is sized andshaped to hold a sample collection unit 50. In accordance with theillustrated embodiment, the rack 200 includes 10 separate receptacles240. However, the rack 200 may include less than ten receptacles, suchas one receptacle 240, or more than ten receptacles 240.

As best shown in FIGS. 5-9, the rack 200 is configured to engage aportion of the rack handler 100, such as, for example, the rotationassembly 150. The rack body 202 includes a first interior surface 250that extends from the bottom 205 toward the top 203 along the verticaldirection, and a second interior surface 260 that extends from thebottom 205 toward the top 203 along the vertical direction V. The firstinterior surface 250 and the second interior surface 260 may be referredto as first wall 250 and a second wall 260, respectively. The secondinterior surface 260 is opposite to the first interior surface 250 so asto at least partially define a slot 270 along the bottom 205 of thesample rack 200. Furthermore, the sample rack 200 includes at least oneinterference groove 252, 262 in either of both of the first interiorsurface 250 and the second interior surface 260. For instance, asillustrated, the sample rack 200 includes a first interference groove252 formed in the first interior surface 250 and a second interferencegroove 262 formed in the second interior surface 260. In otherembodiments, the rack may include a single interference groove.

As illustrated, the rack 200 includes a single slot 270 along the bottom205 of the sample rack 200. However, in alternative embodiments, therack may include a plurality of slots along the bottom 205 for receivingthe a portion of the rack handler 100. For example, the rack 200 mayhave a first slot 270 and a second slot (not shown) that is similar tothe first slot. Multiple slots would allow the rack 200 to be insertedinto the rack handler in either orientation and still be rotatable bythe rotation assembly 150.

Referring to FIGS. 7-9, the first interior surface 250 has a firstportion 254, a second portion 256, and a third portion 258. The firstportion 254 and second portion 256 are angularly offset with respect toeach other so as to define the first interference groove 252. Inparticular, the first portion 254 and the second portion 256 mayintersect to define a first angle α1 therebetween. In the illustratedembodiment, the first angle α1 is less than 180 degrees. In one example,the first angle α1 is between 45 degrees and 135 degrees. The firstangle α1 may not be limited to this stated range. However, inalternative embodiments, the first and second portions 254 and 256 maynot intersect. In other alternative embodiments, the first and secondportions 254 and 256 may not intersect and may be substantially parallelto each other to define the interference groove. Furthermore, as shownin the figures the third portion 258 is angularly offset from the firstand second portions 254 and 256.

Referring to FIGS. 7-9, the second interior surface 260 includes a firstportion 264, a second portion 266, and a third portion 268. The firstportion 264 and a second portion 266 are angularly offset with respectto each other so as to define the second interference groove 262. Thefirst portion 264 and the second portion 266 may intersect to define asecond angle α2 therebetween. In the illustrated embodiment, the firstangle α2 is less than 180 degrees. In one example, the second angle α2is between 45 degrees and 135 degrees. The second angle α2 may not belimited to this stated range. However, in alternative embodiments, thefirst and second portions 264 and 266 may not intersect. In otheralternative embodiments, the first and second portions 264 and 266 maynot intersect and may be substantially parallel to each other to definethe interference groove. As illustrated, the third portion 268 isangularly offset from the first and second portions 264 and 266. Inaddition, the third portion 258 of the first interior surface 250 issubstantially parallel to the third portion 268 of the second interiorsurface 260. In alternative embodiments, the third portion 258 of thefirst interior surface 250 may not be specifically parallel to the thirdportion 268 of the second interior surface 260.

Furthermore, and continuing with FIGS. 7-9, the slot 270 includes afirst wall 250 and a second wall 260 that is substantially a parallel tothe first wall 250. As illustrated, the first and second walls 250, 260are arranged on opposing sides of a first axis A1. The first axis A1 canbe described as the center line of the slot. The first wall 250 has atleast one indentation 252 and the second wall 260 has at least oneindentation 262. The indentation 252 in the first wall 250 has first andsecond portions 254 and 256. The indentation 262 in the second wall 260has first and second portions 264 and 266. The respective first portions254, 264 of each indentation 252, 262 can be oriented along a secondaxis A2 which is offset from the first axis A1. The respective secondportions 256, 266 of each indentation 254, 264 can be oriented along athird axis A3 which is offset from the first axis A1 and second axis A2.Furthermore, the distance between the second portions 256, 266 of theindentations 252, 262 generally corresponds to the size of theengagement element 160.

As illustrated in FIGS. 7-9, the slot 270 extends from the first side208 to the second side 210 and is located primarily in the base portion220 of the sample rack 200. In addition, the slot 270 is closer to thefirst end 212 than to the second end 214. In other words, the slot 270may be spaced a first distance D1 from the first end 212 and a seconddistance D2 from the second end 214 but the first distance D1 is lessthan the second distance D2. The location of the slot 270 toward thefirst end 212 can facilitate engagement with the rack handler 100 androtation by the rack handler 100 as shown and further described below.

Continuing with FIGS. 7-9, one end of the slot 270 may be widened inorder to allow for easy insertion of the engagement element 160 when thesample rack is not perfectly aligned with the rotation assembly 150. Inalternative embodiment, both ends of the slot 270 could be widened aswell.

Referring back to FIGS. 5 and 6, the sample rack 200 includes a recess290 that is adapted to engage the transport system 120 of the rackhandler 100. As shown, the rack body 202 defines a recess 290 thatextends into the second end 214 of the rack body 202 along thelongitudinal direction L. Furthermore, the recess 290 extends from thefirst side 208 to the second side 210. The recess 290 is shown spacedslightly above the bottom surface 206 along the vertical direction V inorder to engage a conveyor guide element 130. The recess 290 engages aconveyor guide element along a substantially portion of the travel pathP through the rack handler 100 and helps to stabilize the rack 200during transport along the travel path P.

Turning to FIGS. 10-13, the engagement element 160 is designed to engagewith a portion of the sample rack 200 to move the sample rack 200 from afirst orientation where the side 210 faces the test device 20 into asecond orientation that is rotationally different than the firstorientation. As shown in FIGS. 10 and 12, the sample rack 200 may bemoved over the rotation assembly 150 so that the protrusion 164 slideswithin the slot 270. In this configuration, the sides of the protrusion164 are generally parallel to the first and second interior surfaces 250and 260 of the sample rack 200.

As shown in FIGS. 11 and 13, the controller 310 can cause the engagementelement 160 to rotate in the slot 270 of the sample rack 200 a firstrotational distance R1 to engage the at least one interference groove252, 262 in the sample rack 200. In particular, the first and secondends 180 and 182 of the protrusion 164 can engage with and abut thefirst and second interference grooves 252 and 262, respectively. Whenthe protrusion 164 is engaged with the interference groove 252, 262, theengagement element rotates a second rotational distance R2 (not shown)to rotate the sample rack 200 from the first orientation (e.g. see FIG.17) into the second orientation (e.g. FIG. 19). Thus, it can be seenthat the engagement element 160 rotates a first rotational distance tofully engage the sample rack 200 and rotates a second rotationaldistance to cause the sample rack 200 to rotate into the secondorientation. In this manner, the second rotational distance is greaterthan the first rotation distance. When the sample rack is in the secondorientation, the engagement element 160 can disengage from the samplerack 200. In particular, the engagement element 160 can rotate in asecond rotational direction R2 that is opposite to the first rotationaldirection R1 in order move the protrusion 164 out of engagement with theinterference groove 252, 262. When the protrusion 164 is aligned withthe slot 270, similar to that which is shown in FIG. 12, the sample rack200 can be translated along the travel path P by the transport system120.

As illustrated in FIGS. 14-20, the transport system 120 advances thesample rack 200 from the input staging region 102 in a first direction112 to the first test device 10 until the sample rack 200 is positionedin the lateral portion 104. The transport system 120 can advance thesample rack 200 in a lateral direction 116 into a testing positionproximate an analyzer (not shown) in the test device 10. Once testing iscomplete, the transport system 120 advances the sample rack 200 furtheralong the lateral portion 104 until the sample rack is aligned with therotation region 106, as shown in FIG. 16.

Continuing with FIGS. 14-20, the transport system 120, via a controller310, advances the sample rack 200 over the engagement element 160. Asdiscussed above, the first sensor 352 determines when the sample rack200 is engaged with the engagement element 160 of the rack handler inthe first orientation (similar to the position shown in FIGS. 10, 12, &17). The controller 310 causes the motor 330 to begin rotation of theengagement element 160. The engagement element 160 then rotates intoengagement with the interference groove 252, 262 of the slot 270, asdescribed above (and shown in FIGS. 11 and 13).

Referring to FIGS. 18-20, continued rotation of the engagement element160 while the engagement element 160 is engaged with the groove 252, 262causes the sample rack 200 to rotate about a vertical axis 4 of the rackhandler 100 into second orientation, as shown in the progression ofFIGS. 17, 18 and 19. The second sensor 354 determines when the samplerack 200 is in the second orientation and is still engaged with theengagement element 160 (i.e., the protrusion is engaged with the grooves252, 262). The controller 310 reverses rotation of the engagementelement 160 so that the engagement element 160 is aligned with slot 270.The second sensor 354 that determines when the sample rack is in thesecond orientation and is disengaged from the engagement element, i.e.the protrusion in disengaged with the grooves 252, 262 as shown in FIGS.11 and 13, and rack 200 is not over the rotation assembly 150.

Referring to FIGS. 19 and 20, the controller 310 can then cause thetransport system 120 to advance the sample rack 200 along a direction116 until the sample rack 200 has disengaged from the engagement element160 completely. If the sample rack 200 is disengaged, the transportsystem 120 may be used to advance the sample rack along the direction115 in travel region 108.

In the second orientation as shown in FIG. 20, the longitudinal end 212of the sample rack may face the first test device 10 (or second testdevice if present). In this manner, the sample rack 200 is oriented tobe inserted into the portal 26 of the second test device 20. Thetransport system 120 translates the sample rack 200 in the seconddirection 116. Once the sample rack 200 is positioned adjacent to portal26, guide elements (not shown) pull the sample rack 200 along the firstdirection 112 into the housing 22 of the second test device 20 so thatthe sample(s) can be further analyzed, as shown in FIG. 1. When testingis complete, the sample rack 200 is pushed out onto the travel path P.The transport system 120 advances the sample rack 200 into the outputstaging region 110.

The invention includes the following illustrative embodiments:

Embodiment 1 is a sample analysis system for analyzing a sample. Thesample analysis system includes at least one test device for analyzingthe sample and a rack handler. The rack handler is operable to move asample from a first location to a second location along a travel path.The rack handler has a rotation assembly that includes a) an engagementelement for engagement with the sample rack, and b) a motor coupled tothe engagement element and is operable to cause rotation of theengagement element. The rotation assembly rotates the sample rack from afirst orientation into a second orientation along the travel path whenthe engagement element engages the sample rack and when the sample rackis disposed on the rack handler.

Embodiment 2 is the sample analysis system of embodiment 1 but furthercomprises at least one sensor that determines a position of the samplerack on the travel path when the sample rack is present on the rackhandler. The sample analysis system also includes a controllerelectronically coupled to the at least one sensor and the motor. Thecontroller is configured to, in response to receiving data concerningthe position of the sample rack, cause the rotation assembly to rotatethe engagement element.

Embodiment 3 is the sample analysis system of embodiment 2, wherein theat least one sensor is a first sensor that determines when the samplerack is in the first orientation and is engaged with the engagementelement when the sample rack is present on the rack handler.

Embodiment 4 is the sample analysis system of embodiment 2, wherein theat least one sensor is a second sensor that is configured to determinewhen the sample rack is in the second orientation and is disengaged fromthe engagement element when the sample rack is present on the rackhandler. The controller is configured to, in response to a determinationthat the sample rack is in the second orientation and is disengaged fromthe engagement element, cause the rack handler to move the sample rackalong the travel path.

Embodiment 5 is the sample analysis system of embodiment 1, wherein theengagement element extends along the vertical axis, such that the motoris adapted to cause the engagement element to rotate about the verticalaxis.

Embodiment 6 is the sample analysis system of embodiment 1, furthercomprising a sample rack for carrying a sample collection unit, thesample rack including a slot, wherein the engagement element is sized toengage the slot of the sample rack.

Embodiment 7 is the sample analysis system of embodiment 6, wherein thesample rack includes at least one interference groove disposed along theslot, wherein the engagement element rotates in the slot of the samplerack a first rotational distance to engage the at least one interferencegroove in the sample rack.

Embodiment 8 is the sample analysis system of embodiment 7, wherein theengagement element rotates a second rotational distance to rotate thesample rack from the first orientation into the second orientation whenthe engagement is engaged with the at least one interference groove ofthe sample rack.

Embodiment 9 is the sample analysis system of embodiment 8, wherein thesecond rotational distance is greater than the first rotationaldistance.

Embodiment 10 is the sample analysis system of embodiment 1, wherein theengagement element disengages from the sample rack after the sample rackrotates into the second orientation when the sample rack is present.

Embodiment 11 is the sample analysis system of embodiment 1, wherein theengagement element includes a base and a protrusion that projects upwardfrom the base, wherein when the sample rack is present on the rackhandler, rotation of the engagement element when the protrusion engagesthe sample rack cause the sample rack to rotate about the vertical axis.

Embodiment 12 is the sample analysis system of embodiment 11, whereinthe protrusion projects from the base along the vertical axis.

Embodiment 13 is the sample analysis system of embodiment 11, whereinthe protrusion is an elongated tab.

Embodiment 14 is the sample analysis system of embodiment 11, whereinthe protrusion has a polygonal cross-sectional shape.

Embodiment 15 is the sample analysis system of embodiment 11, whereinthe protrusion is a plurality of protrusions that are spaced apart andaligned with each other along an axis that intersects and isperpendicular to the vertical axis.

Embodiment 16 is the sample analysis system of embodiment 1, wherein therotation assembly includes a shaft that extends along the vertical axis,wherein the shaft rotationally couples the motor to the engagementelement so that operation of the motor rotates the engagement element.

Embodiment 17 is the sample analysis system of embodiment 1, wherein thebase defines an upper surface, a lower surface opposite the uppersurface along the vertical axis, and a central recess that extends fromthe lower surface into the base along the vertical axis, wherein theshaft extends into the central recess of the engagement element torotationally couple the engagement element to the motor.

Embodiment 18 is rack handler for a sample analysis system. The rackhandler comprises a travel path along which a sample rack moves from onelocation to another location, and a rotation assembly. The rotationassembly is for rotating a sample rack that includes a slot and alsoincludes a) an engagement element including a base and a protrusion thatprojects upward from the base, wherein the protrusion is sized to engagethe slot of the sample rack when the sample rack is present, and b) amotor coupled to the engagement element and being operable to cause theengagement element to rotate. Rotation of the engagement element whenthe protrusion engages the slot causes the sample rack to rotate about avertical axis.

Embodiment 19 is the rack handler of embodiment 18, wherein theprotrusion projects from the base along the vertical axis.

Embodiment 20 is the rack handler of embodiment 18, wherein theprotrusion is an elongated tab.

Embodiment 21 is the rack handler of embodiment 18, wherein theprotrusion has a polygonal cross-sectional shape.

Embodiment 22 is the rack handler of embodiment 18, wherein theprotrusion is a plurality of protrusions that are spaced apart andaligned with each other along an axis that is perpendicular to thevertical axis.

Embodiment 23 is the rack handler of embodiment 18, further comprising ashaft that a) extends along the vertical axis, and b) rotationallycouples the motor to the engagement element so that operation of themotor rotates the engagement element.

Embodiment 24 is the rack handler of embodiment 23, wherein the basedefines an upper surface, a lower surface opposite the upper surfacealong the vertical axis, and a central recess that extends from thelower surface into the base along the vertical axis. The shaft theextends into the central recess of the engagement element torotationally couple the engagement element to the motor.

Embodiment 25 is the rack handler of embodiment 18, wherein theengagement element is rotatable about the vertical axis in a firstrotational direction and a second rotational direction that is oppositethe first rotational direction.

Embodiment 26 is the rack handler of embodiment 18, wherein theengagement element is rotatable 360 degrees about the vertical axis inat least one of a first rotational direction and a second rotationaldirection.

Embodiment 27 is a method of moving a sample rack on a sample analysissystem. The method includes moving the sample rack along a travel pathuntil an engagement element of a rotation assembly is received by a slotdefined by the sample rack. The method also includes rotating theengagement element about a vertical axis a first rotational distance ina first rotational direction until the engagement element engages aninterference groove in the slot of the sample rack. The method alsoincludes, after the engagement element engages the interference groove,further rotating the engagement element about the vertical in the firstrotational direction to rotate the sample rack from a first orientationinto a second orientation that is different from the first orientation.

Embodiment 28 is the method of embodiment 27, further comprising thestep of sensing, via a sensor, when the engagement element is receivedby the slot.

Embodiment 29 is the method of embodiment 27, further includes, afterthe sample rack is in the second orientation, rotating the engagementelement about the vertical axis in a second rotational direction that isopposite the first rotational direction until the engagement element nolonger engages the interference groove of the sample rack.

Embodiment 30 is the method of embodiment 29, further comprising, afterrotating the engagement element about the vertical axis in a secondrotational direction, moving the sample rack along the travel path outof engagement with the engagement element so that the engagement elementis no longer received by the slot of the sample rack.

Embodiment 21 is the method of embodiment 30, further comprising,sensing, via a sensor, when the engagement element is no longer receivedby the slot of the sample rack.

The invention as described in the present disclosure is capable ofexploitation in industry in accordance with how it can be made and/orused.

Those skilled in the art will also appreciate that the presentdisclosure may be applied to other applications and may be modifiedwithout departing from the scope of the present disclosure. Accordingly,the scope of the present disclosure is not intended to be limited to theexemplary embodiments described above, but only by the appended claims.

1. A sample analysis system for analyzing a sample, comprising: at leastone test device for analyzing the sample; and a rack handler operable tomove a sample from a first location to a second location along a travelpath, the rack handler having a rotation assembly including a) anengagement element for engagement with the sample rack, and b) a motorcoupled to the engagement element and is operable to cause rotation ofthe engagement element, wherein the rotation assembly rotates the samplerack from a first orientation into a second orientation along the travelpath when the engagement element engages the sample rack when the samplerack is disposed on the rack handler.
 2. The sample analysis system ofclaim 1, further comprising: at least one sensor that determines aposition of the sample rack on the travel path when the sample rack ispresent on the rack handler, a controller electronically coupled to theat least one sensor and the motor, the controller being configured to,in response to receiving data concerning the position of the samplerack, cause the rotation assembly to rotate the engagement element. 3.The sample analysis system of claim 2, wherein the at least one sensoris a first sensor that determines when the sample rack is in the firstorientation and is engaged with the engagement element when the samplerack is present on the rack handler.
 4. The sample analysis system ofclaim 2, wherein the at least one sensor is a second sensor that isconfigured to determine when the sample rack is in the secondorientation and is disengaged from the engagement element when thesample rack is present on the rack handler, wherein the controller isconfigured to, in response to a determination that the sample rack is inthe second orientation and is disengaged from the engagement element,cause the rack handler to move the sample rack along the travel path. 5.The sample analysis system of claim 1, wherein the engagement elementextends along the vertical axis, such that the motor is adapted to causethe engagement element to rotate about the vertical axis.
 6. The sampleanalysis system of claim 1, further comprising a sample rack forcarrying a sample collection unit, the sample rack including a slot,wherein the engagement element is sized to engage the slot of the samplerack.
 7. The sample analysis system of claim 6, wherein the sample rackincludes at least one interference groove disposed along the slot,wherein the engagement element rotates in the slot of the sample rack afirst rotational distance to engage the at least one interference groovein the sample rack.
 8. The sample analysis system of claim 7, whereinthe engagement element rotates a second rotational distance to rotatethe sample rack from the first orientation into the second orientationwhen the engagement is engaged with the at least one interference grooveof the sample rack.
 9. The sample analysis system of claim 8, whereinthe second rotational distance is greater than the first rotationaldistance.
 10. The sample analysis system of claim 1, wherein theengagement element disengages from the sample rack after the sample rackrotates into the second orientation when the sample rack is present. 11.The sample analysis system of claim 1, wherein the engagement elementincludes a base and a protrusion that projects upward from the base,wherein when the sample rack is present on the rack handler, rotation ofthe engagement element when the protrusion engages the sample rack causethe sample rack to rotate about the vertical axis.
 12. The sampleanalysis system of claim 11, wherein the protrusion projects from thebase along the vertical axis.
 13. The sample analysis system of claim11, wherein the protrusion is an elongated tab.
 14. The sample analysissystem of claim 11, wherein the protrusion has a polygonalcross-sectional shape.
 15. The sample analysis system of claim 11,wherein the protrusion is a plurality of protrusions that are spacedapart and aligned with each other along an axis that intersects and isperpendicular to the vertical axis.
 16. A rack handler for a sampleanalysis system, the rack handler comprising: a travel path along whicha sample rack moves from one location to another location; and arotation assembly for rotating a sample rack, the rotation assemblyhaving: an engagement element including a base and a protrusion thatprojects upward from the base, wherein the protrusion is sized to engagethe sample rack when the sample rack is present; and a motor coupled tothe engagement element and being operable to cause the engagementelement to rotate, wherein rotation of the engagement element when theprotrusion engages the sample rack cause the sample rack to rotate abouta vertical axis.
 17. The rack handler of claim 16, further comprising ashaft that a) extends along the vertical axis, and b) rotationallycouples the motor to the engagement element so that operation of themotor rotates the engagement element.
 18. The rack handler of claim 17,wherein the base defines an upper surface, a lower surface opposite theupper surface along the vertical axis, and a central recess that extendsfrom the lower surface into the base along the vertical axis, whereinthe shaft the extends into the central recess of the engagement elementto rotationally couple the engagement element to the motor.
 19. The rackhandler of claim 16, wherein the engagement element is rotatable aboutthe vertical axis in a first rotational direction and a secondrotational direction that is opposite the first rotational direction.20. The rack handler of claim 16, wherein the engagement element isrotatable 360 degrees about the vertical axis in at least one of a firstrotational direction and a second rotational direction.